Authors: Suresh k Devanathan, Michael L Bushnell
Abstract—We describe the p-untestability of faults in combinational circuits. They are similar to redundant faults, but are defined probabilistically. P-untestable fault is a fault that is not detectable after N random pattern simulation or a fault, FAN either proves to be redundant or aborts after K backtracks. We chose N to be about 1000000 and K to be about 1000. We provide a p-untestability detectability algorithm that works in about 85% of the cases, with average of about 14% false negatives. The algorithm is a simple hack to FAN and uses structural information and can be easily implemented. The algorithm does not prove redundancy completely but establishes a fault as a probabilistically redundant, meaning a fault with low probability of detection or no detection.
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[v1] 2013-03-07 08:50:04
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