Authors: Trilok Kumar Pathak, Prabha Singh, L.P.Purohit
In this study, Ni doped ZnO (Zn1-xNixO, x= 0.02, 0.04, 0.07) Diluted magnetic semiconductors (DMSs) thin films onto Si substrates by spin-coating method from a precursor solution containing zinc acetate dissolved in methanol. After deposition, these films were preheated at 3500C for five minute and then annealed at 5500C for three hour for crystallize. Scanning Electron microscopy (SEM) image shows the particle size with an average size of 250 nm. The analysis of X-ray diffraction (XRD) identified that the impurity phase is observed when the Ni content x reaches 0.07. With the increment of x, wurtzite structures degrade gradually. The magnetic properties are measured using Vibrating Sample Magnetometer (VSM) at room temperature; the Zn1-xNixO (x=0.07) thin film shows ferromagnetism. The magnetic moment depends on Ni concentration and increases continuously as Ni concentration increases.
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[v1] 2014-05-07 03:38:38
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